Citation:
M. Juhl, C. Mendoza, J. P. B. Mueller, F. Capasso, and K. Leosson, “Performance characteristics of 4-port in-plane and out-of-plane in-line metasurface polarimeters,” Optics Express, vol. 25, no. 23, pp. 28697-28709, 2017.
MURI Metasurfaces
Active Metasurfaces for Advanced Wavefront Engineering and Waveguiding
Harvard University School of Engineering and Applied Sciences
29 Oxford St.
Cambridge, MA 02138